Presentation Title

A Characterization of Thin Film Oxide Growth on Ferrous and Non-Ferrous Metals by Spectral Analysis

Faculty Mentor

Dr. Vilupanur Ravi, Chemical and Materials Engineering, Cal Poly Pomona

Start Date

17-11-2018 2:30 PM

End Date

17-11-2018 2:45 PM

Location

C301

Session

Oral 3

Type of Presentation

Oral Talk

Subject Area

engineering_computer_science

Abstract

Metals used in various industrial applications are commonly exposed to high operating temperatures for long durations of time. Under these harsh conditions, it has been shown that they are susceptible to oxidation, as a result of which the integrity of a component can be compromised during operation leading to the failure of that component or even complete system failure. Traditional methods of evaluating the extent of oxide growth, such as scanning electron microscopy and diffractometry analysis, are not applicable because these tests are destructive in nature, and can interrupt production. It is beneficial to have a method to quickly determine the extent of a material’s oxidation while in service. Optical analytical methods, which include spectral analysis and illuminance, can possibly be used in replacement of the destructive traditional methods by directly studying the effects to light being reflected off the oxide film while varying the angle of incidence. As the oxide film grows, it cycles between the three colors: straw, brown and blue. The wavelength and intensity of the reflected incident light off the oxide film can indicate the state of oxidation. In this study, the early onset of oxide films on UNS C11000, UNS G30400 and UNS R50400, formed at temperatures varying from 125॰C to 900॰C, was analyzed. The color cycle was studied, using a spectrophotometer, to observe minute differences in the range of colors observed as the oxide film continues to grow. Results were compared to traditional methods such as scanning electron microscopy with energy dispersive spectroscopy (SEM/EDS) and optical microscopy, and further characterized by non-contact profilometry and X-Ray diffraction (XRD).

Key Words: high temperature oxidation, spectral analysis, oxide films, copper, stainless steel, titanium, optical analysis

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Nov 17th, 2:30 PM Nov 17th, 2:45 PM

A Characterization of Thin Film Oxide Growth on Ferrous and Non-Ferrous Metals by Spectral Analysis

C301

Metals used in various industrial applications are commonly exposed to high operating temperatures for long durations of time. Under these harsh conditions, it has been shown that they are susceptible to oxidation, as a result of which the integrity of a component can be compromised during operation leading to the failure of that component or even complete system failure. Traditional methods of evaluating the extent of oxide growth, such as scanning electron microscopy and diffractometry analysis, are not applicable because these tests are destructive in nature, and can interrupt production. It is beneficial to have a method to quickly determine the extent of a material’s oxidation while in service. Optical analytical methods, which include spectral analysis and illuminance, can possibly be used in replacement of the destructive traditional methods by directly studying the effects to light being reflected off the oxide film while varying the angle of incidence. As the oxide film grows, it cycles between the three colors: straw, brown and blue. The wavelength and intensity of the reflected incident light off the oxide film can indicate the state of oxidation. In this study, the early onset of oxide films on UNS C11000, UNS G30400 and UNS R50400, formed at temperatures varying from 125॰C to 900॰C, was analyzed. The color cycle was studied, using a spectrophotometer, to observe minute differences in the range of colors observed as the oxide film continues to grow. Results were compared to traditional methods such as scanning electron microscopy with energy dispersive spectroscopy (SEM/EDS) and optical microscopy, and further characterized by non-contact profilometry and X-Ray diffraction (XRD).

Key Words: high temperature oxidation, spectral analysis, oxide films, copper, stainless steel, titanium, optical analysis