Presentation Title

SHORT-RUN CONTEXTS AND IMPERFECT TESTING FOR CONTINUOUS SAMPLING PLANS

Faculty Mentor

Daniel Jeske

Start Date

18-11-2017 10:00 AM

End Date

18-11-2017 11:00 AM

Location

BSC-Ursa Minor 102

Session

Poster 1

Type of Presentation

Poster

Subject Area

physical_mathematical_sciences

Abstract

Continuous sampling plans are used to ensure a high level of quality for items produced in long-run contexts. The basic idea of these plans is to alternate between 100% inspection and a reduced rate of inspection frequency. Any inspected item that is found to be defective is replaced with a non-defective item. Because not all items are inspected, some defective items will escape to the customer. Analytical formulas were developed that measure both the customer perceived quality and also the level of inspection effort. The analysis of continuous sampling plans does not apply to short-run contexts, where only a finite-size batch of items is to be produced. In this paper, a simulation model is used to analyze the customer perceived quality and the level of inspection effort for short-run contexts. A parameter representing the effectiveness of the test used during inspection is introduced to the analysis, and an analytical approximation is discussed. An application of the simulation model that helped answer questions for the U.S. Navy is discussed.

Summary of research results to be presented

CSP-1 was designed under the assumption that the number of items to be inspected was infinitely large, as in a production line assembly context, for example. As a consequence, Dodge’s analytical analysis of CSP-1 plans do not apply in short-run contexts. Therefore, this research developed a simulation model, in the R programming language, for CSP-1 plans in order to provide a means to understand the impact of short-run contexts. Furthermore, CSP-1 plans assume the test procedures for items were perfect. The simulation model implements a test effectiveness parameter that allowed recognition that defective items could escape the test procedure. The simulation model was used to answer design questions for the United States Navy.

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Nov 18th, 10:00 AM Nov 18th, 11:00 AM

SHORT-RUN CONTEXTS AND IMPERFECT TESTING FOR CONTINUOUS SAMPLING PLANS

BSC-Ursa Minor 102

Continuous sampling plans are used to ensure a high level of quality for items produced in long-run contexts. The basic idea of these plans is to alternate between 100% inspection and a reduced rate of inspection frequency. Any inspected item that is found to be defective is replaced with a non-defective item. Because not all items are inspected, some defective items will escape to the customer. Analytical formulas were developed that measure both the customer perceived quality and also the level of inspection effort. The analysis of continuous sampling plans does not apply to short-run contexts, where only a finite-size batch of items is to be produced. In this paper, a simulation model is used to analyze the customer perceived quality and the level of inspection effort for short-run contexts. A parameter representing the effectiveness of the test used during inspection is introduced to the analysis, and an analytical approximation is discussed. An application of the simulation model that helped answer questions for the U.S. Navy is discussed.