Presentation Title

Scanning Probe Microscopy Measurements of Mechanical Properties of 2D Materials

Faculty Mentor

Yongtao Cui

Start Date

18-11-2017 2:15 PM

End Date

18-11-2017 3:15 PM

Location

BSC-Ursa Minor 32

Session

Poster 3

Type of Presentation

Poster

Subject Area

physical_mathematical_sciences

Abstract

2D materials have wide applications to many fields in sciences, and current researchers have many interests in the mechanical and electrical properties of such materials. Graphene, is one example of a 2D material, and it is a single layer of sp2-hybridized carbon atoms. It has many exotic mechanical, electrical, and thermal properties, yet there still remain many questions that arise from graphene and its large-scale production in the market. My research is composed of studying the structure of bilayer and monolayer graphene, while trying to understand the mechanical properties, such as the stiffness and strength of the materials, using scanning probe microscopy measurements. Silicon dioxide and hexagonal-boron nitride were both used as substrates under the Atomic Force Microscopy (AFM) to learn more about the Young’s modulus of both bilayer and monolayer graphene. Scotch tape method was used to produce monolayer and bilayer graphene islands, and a light microscope was used to identify the location of the islands on the substrates. Raman Spectroscopy was used to confirm the monolayer and bilayer islands, and the Atomic Force Microscope (AFM) was used to image the islands on the micrometer scale. Force-distance curves were measured by the AFM on the graphene islands. The strength and stiffness of the structure were extracted from these measurements through modeling and analysis. Our results from the AFM show consistency from previous results of the Young’s Modulus of monolayer graphene, but further investigations are needed to figure out more of mechanical strength, and topological properties of bilayer graphene.

KEYWORDS: Graphene, bilayer, monolayer, Atomic Force Microscopy, Raman Spectroscopy, Young’s Modulus

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Nov 18th, 2:15 PM Nov 18th, 3:15 PM

Scanning Probe Microscopy Measurements of Mechanical Properties of 2D Materials

BSC-Ursa Minor 32

2D materials have wide applications to many fields in sciences, and current researchers have many interests in the mechanical and electrical properties of such materials. Graphene, is one example of a 2D material, and it is a single layer of sp2-hybridized carbon atoms. It has many exotic mechanical, electrical, and thermal properties, yet there still remain many questions that arise from graphene and its large-scale production in the market. My research is composed of studying the structure of bilayer and monolayer graphene, while trying to understand the mechanical properties, such as the stiffness and strength of the materials, using scanning probe microscopy measurements. Silicon dioxide and hexagonal-boron nitride were both used as substrates under the Atomic Force Microscopy (AFM) to learn more about the Young’s modulus of both bilayer and monolayer graphene. Scotch tape method was used to produce monolayer and bilayer graphene islands, and a light microscope was used to identify the location of the islands on the substrates. Raman Spectroscopy was used to confirm the monolayer and bilayer islands, and the Atomic Force Microscope (AFM) was used to image the islands on the micrometer scale. Force-distance curves were measured by the AFM on the graphene islands. The strength and stiffness of the structure were extracted from these measurements through modeling and analysis. Our results from the AFM show consistency from previous results of the Young’s Modulus of monolayer graphene, but further investigations are needed to figure out more of mechanical strength, and topological properties of bilayer graphene.

KEYWORDS: Graphene, bilayer, monolayer, Atomic Force Microscopy, Raman Spectroscopy, Young’s Modulus